SiVenture is a member of the National Microelectronics Institute. In our Maidenhead, UK facility, we have eight separate laboratories providing a range of security, fault and quality analysis services for all types of chips and other hardware devices. SiVenture offers these comprehensive facilities under one roof, saving time while simplifying the testing process.
SiVenture uses a comprehensive set of tools for preparing, de-processing, probing and modifying samples. We also have a wide range of microscopy - optical, Focused Ion Beam (FIB), Scanning Electron (SEM) and Scanning Probe (SPM) - as well as comprehensive electronic measurement and signal analysis tool-sets.
SiVenture is able to edit the first silicon to test redesign ideas. For short-notice chip rewiring, we have a state-of-the-art Focused Ion Beam (FIB) service to ensure modifications can be made on time and within budget.
Micromachining and nanotechnology
SiVenture's submicron imaging tools and our capability to machine with a 10nm ion probe enable us to prototype even the smallest structures. Using our Scanning Probe Microscope (SPM), we can image and manipulate down to individual atoms.
Specialized device processing
Our Maidenhead facility contains much of the equipment required for specialized processing of research structures. The entire facility is clean to Class 10000 and spaces are available for Class 100 processing.
Circuit and device testing
SiVenture can help you fix your designs by implementing repairs to non-functioning devices using a range of electrical test equipment. We are able to provide the answers before and after Focused Ion Beam (FIB) circuit edit.
SiVenture can