For the ultimate in high-resolution surface measurements, SiVenture
has a Digital Instruments Scanning Probe Microscope (SPM).
Unique to this technique is its ability to acquire very
precise surface measurements in all three dimensions: x,
y, and z. Typically, the lateral resolution (x and y directions)
is 20Å and
depth resolution (z) measurements are better than 1Å.
Although it is primarily used to measure surface topography
via contact or non- contact Atomic Force Microscopy (AFM),
the SPM is extremely versatile and may be used in a number
of additional modes including: Magnetic Force Microscopy (MFM),
Electric Force Microscopy and Scanning Capacitance Mode. This
flexibility allows various surface features to be measured.
