An electron microscope is primarily an imaging tool. Because resolution is the key factor, SiVenture has selected the Hitachi S-4700 Scanning Electron Microscope with 1.5 nm available - the best on the market. This is achieved through the cold field emission electron source, in practice unique to the top-end Hitachi microscopes. SiVenture combines high resolution with the Oxford Instruments Inca EDS system for mapping elemental composition, a Robinson backscatter detector as well as EBIC (electron beam induced current) for circuit and electronic device analysis.
